AVEVA™ Products Feedback Portal

Welcome to our new feedback site!


We created this site to hear your enhancement ideas, suggestions and feedback about AVEVA products and services. All of the feedback you share here is monitored and reviewed by the AVEVA product managers.

To start, select the product of your interest in the left column. Then take a look at the ideas in the list below and VOTE for your favorite ideas submitted by other users. POST your own idea if it hasn’t been suggested yet. Include COMMENTS and share relevant business case details that will help our product team get more information on the suggestion. Please note that your ideas will first be moderated before they are made visible to other users of this portal.

This page is for feedback for specific AVEVA solutions, excluding PI Systems and Data Hub. For links to these other feedback portals, please see the tab RESOURCES below.

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Ideas

    Showing 11 of 791

    Re-enable viewing utilities in the read-only OMI Layout editor

    The Read-Only variant of the OMI Layout editor has numerous viewing and navigation features disabled that severely limit its usefulness. As these features do not modify the content of the layout, they should be enabled to improve developer experie...
    Rob Budak 10 months ago in Application Server / Layout Editor 1

    Support a canvas type layout

    Current layouts are organised in rigid panes which are useful in many circumstances, but there is a need to use a canvas layout with custom placement that allows a user to place graphics and apps whereever they want and to wire them together.
    Ernst Van Wyk over 1 year ago in Application Server / Layout Editor / OMI desktop runtime / OMI web runtime 0

    Modification of the layout background color should be done through the layout script

    I have access to two distinct Galaxy Style Libraries in one galaxy and would like to call with single button: light and dark. I aim to modify the layout's background color using a layout script. Currently color changes works only for Apps but not ...
    Himanshu Saini about 1 year ago in Application Server / Layout Editor 0

    Allow adjustment of quality balance

    The problem customer is facing is mismatching Quality Balance with Lot Group Balance. They would like to reset a given lot group such that Quality Balance = Lot Group Balance. Quality survey is not an option as it simply set the quality of the who...
    Nina NICHOLLS over 1 year ago in Production Management (AMPLA MES) / Inventory / Material Quality 0 Future consideration

    Evaluate fields when Quality moved forward

    Evaluated fields are not calculated when quality is moved forward. This would be an issue for the Material Accounting solution. In the configuration below, Re_SO4 for WorkCenter2 will not be evaluated for a QMF record. (We just need to run the eva...
    Priyanka VINAYCHANDER about 6 years ago in Production Management (AMPLA MES) / Material Quality 0 Future consideration

    Use destination material property should display fields from the destination

    Requested by BHP Chile Currently today when we set the use destination quality field if the field is present at the source then we display the destination value if the field is only present at the destination but not the source we do not see the f...
    Nina NICHOLLS over 3 years ago in Production Management (AMPLA MES) / Material Quality 0 Future consideration

    thresholds and specifications for MQ evaluated fields

    https://schneiderampla.atlassian.net/browse/CE-2127 System Info]Ampla Versions: v7.3Operating System: N/A [Raised by]Customer Company: BMAContact: <rodney.banister@aveva.com> [Problem Summary] : In quality module customer need to have Specif...
    Nina NICHOLLS about 5 years ago in Production Management (AMPLA MES) / Material Quality 1 Future consideration

    Allow MQ overtime

    It is common to have the quality of same lot change overtime due to chemical process in processing and leaching areas or further analysis of blocks in mine area. Currently we lack this functionality
    Mehrnoosh KHODAVERDY about 5 years ago in Production Management (AMPLA MES) / Material Quality 1 Future consideration

    Quality reporting point X-Bar Chart sample size results in last charted value drop significantly

    https://schneiderampla.atlassian.net/browse/CE-1891 [System Info]Ampla Versions: 6.5MR1Operating System:Windows 2012 Server R2 [Raised by]Customer Company: RoyhillCF Status: StandardCustomer Contact: kehgan.hau@royhill.com.auSR Reference: 95117946...
    Nina NICHOLLS almost 6 years ago in Production Management (AMPLA MES) / Material Quality 0 Future consideration

    Material Quality line chart should not accumulate field values with the same sample period together

    https://schneiderampla.atlassian.net/browse/CE-1874 [System Info]Ampla Versions: 7.2 R2Operating System:Windows 2012 Server R2 [Raised by]Customer Company: RoyhillCF Status: StandardCustomer Contact: kehgan.hau@royhill.com.auSR Reference: 95117796...
    Nina NICHOLLS about 6 years ago in Production Management (AMPLA MES) / Charting / Material Quality 0 Future consideration